Model 2790 SourceMeter® Switch System User’s Manual 5-31Test procedureThe basic test procedure for using memory patterns to perform contact tests on a dual-stateinflator using scanning is shown in Table 5-7. The same test procedure using individualmemory pattern location recall is shown in Table 5-8.This procedure sets up three memory locations for the necessary relay closures. Eachmemory location is set up as follows:• Delay: 0s• Function: 2-wire ohms• Range: 100• Integration period: 1 PLCAfter setting up memory locations (Table 5-7), the scan is enabled, triggered, and readingsare stored in the buffer for recall once the scan is complete. For the memory pattern loca-tion recall shown in Table 5-8, memory locations are first set up, and each location isrecalled in succession.Table 5-7Command sequence for memory patterns test example using scanningCommand Sequence Description*RST Restore GPIB defaults.ROUT:MEM:CLE:ALL Clear all memory pattern locations.Set up memory location 1:ROUT:MEM:CHAN 1,(@101,114,118) Set channels 1, 14, and 18 for memory location 1.ROUT:MEM:DEL 1,0 Set delay to 0.ROUT:MEM:READ:STAT 1, ON Enable reading.SENS:FUNC 'RES',(@M1) Select 2-wire ohms.SENS:RES:RANG 100,(@M1) Select 100Ω range.SENS:RES:NPLC 1,(@M1) Select 1 PLC.Set up memory location 2:ROUT:MEM:CHAN 2,(@104,114,118) Set channels 4, 14, and 18 for memory location 2.ROUT:MEM:DEL 2,0 Set delay to 0.ROUT:MEM:READ:STAT 2, ON Enable reading.SENS:FUNC 'RES',(@M2) Select 2-wire ohms.SENS:RES:RANG 100,(@M2) Select 100Ω range.SENS:RES:NPLC 1,(@M2) Select 1 PLC.
