HP 5890 Series II manuals
5890 Series II
Table of contents
- Table Of Contents
- Table Of Contents
- Table Of Contents
- Table Of Contents
- Table Of Contents
- Chapter 1 — Columns and Fittings
- Column oven
- Column placement
- Hewlett•Packardcapillary columns
- Fittings
- Liners/adapters and inserts, general
- Inlet/detector liners/adapters
- Detector liners/adapters
- ECD and TCD adapters
- Liner/adapter installation
- Inlet inserts
- Split/splitless or split•onlycapillary inlet inserts
- Jet replacement, FIDs or NPDs
- Chapter 2 — Keyboard and Displays
- Displaying setpoints
- Entering setpoints
- Keyboard operation, INET control
- Protecting setpoints
- Loading default setpoints
- Chapter 3 — Temperature Control
- temperature control
- Valid setpoint ranges
- Cryogenic (sub•ambient)oven control
- Programming oven temperature
- Oven status
- Oven safety
- Fault: messages
- After a power failure
- Oven temperature calibration
- Chapter 4 — Electronic Flow Sensing
- Displaying gas flow rate
- Designating gas type
- Electronic flow sensor (EFS) calibration
- Preparation
- Setting the GAIN calibration value
- Entering specific ZERO and GAIN values
- Chapter 5 — Signal Output
- Zeroing signal output
- Signal attenuation
- Switching off the +1 mV output
- Test signal output
- Instrument network (INET)
- An instrument
- Active workspace
- INET operation
- Automatic INET reconfiguration
- Switching between Global and Local
- INET/HP•ILaddresses
- HP•ILloopback test
- Warn: and fault: messages
- File compatibility with data handling devices
- How do I change modes
- How to convert HP 339X Integrator workfiles from 5890A to SERIES II mode
- Chapter 6 — Inlet Systems
- Packed column inlet
- Electronic flow sensor
- Septum•purgedpacked column inlet
- Problems at high inlet temperatures
- Septum purge
- Split/splitless capillary inlet
- Carrier gas considerations
- Initial column head pressure
- Split sampling
- Splitless sampling
- Injection technique, split/splitless sampling
- Chapter 7 — Detector Systems
- Capillary makeup gas flow rate
- FID and NPD jets
- Flame ionization detector (FID)
- FID flameout problems
- Performance considerations
- Electron capture detector (ECD)
- Temperature
- Background level
- Thermal conductivity detector (TCD)
- Optimizing performance
- Analyzing for hydrogen, special considerations
- TCD•to•FID series connection
- Capillary column considerations
- Flame photometric detector (FPD)
- Flame ignition problems
- Chapter 8 — Preventive Maintenance
- Conditioning columns
- Re)Packing columns
- Changing septa
- Insert/liner care
- Cleaning
- Split/splitless capillary inlets
- Insert care
- Leaks
- Liner and/or insert care
- Repacking a split insert
- Metal inserts and/or liners
- Jet exchange/replacement
- Ignition problems
- Removing/replacing the NPD collector
- Type B NPD transformer/collector assembly
- Reinstallation
- Frequency test
- Thermal cleaning
- Packed column
- Radioactivity leak test (wipe test)
- Flame photometric detector
- Cleaning/replacing the FPD jet
- FPD leak testing (GC with electronic flow sensor)
- FPD leak testing (GC without electronic flow sensor)
- Conditioning chemical traps
- Chapter 9 — Chromatographic Troubleshooting
- Introduction
- Wander and drift
- Noise
- Spiking
- Retention time symptoms
- Peak symptoms
- Deformed peaks
- Troubleshooting valve systems
- Locating leaks
- Pressure check
- Electronic pressure control
- Safety shutdown
- Proper configuration
- Switch setting examples
- Chapter 10 — Test Sample Chromatograms
- test sample chromatograms
- Test sample chromatograms
- Index
5890 Series II
Table of contents